Laser induced crystal defects in monocrystalline silicon
Laser induced crystal defects in monocrystalline silicon
Mar 4, 2019
spiedigitallibrary.org
SOLVED: When silicon chips are fabricated, defects in materials (e.g. silicon) and manufacturing errors can result in defective circuits. A very common defect is for one wire to affect the signal in another. This is called a cross-talk fault. A special class of cross-talk fault is when a signal is connected to a wire that has a constant logical value (e.g. a power supply wire). In this case, we have a stuck-at-0 or a stuck-at-1 fault, and the affected wire always has a logical value of 0 or 1, r
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