Abstract: In this study, we introduce a histogram post-processing technique for Single Photon Avalanche Diode (SPAD)-based direct Time of Flight (d-ToF) depth measurement systems, designed to address ...
Abstract: This article presents a novel fault diagnosis method for open-circuit faults of insulated gate bipolar transistors (IGBTs) and current sensor faults in three-phase sinusoidal pulsewidth ...
Idaho National Laboratory launches full-scale molten chloride fuel production for the MCRE, marking a historic milestone in ...
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