Abstract: As CMOS technology continues to scale, the associated reduction in device reliability margins has made accurate reliability evaluation a critical component of digital circuit design.
Abstract: This paper addresses the critical issue of false data injection attacks (FDIA) in smart grids by proposing a novel multi-stage dynamic attack and defense game model. This model not only ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback