Abstract: Atomic Force Microscopy (AFM) has been a broadly used platform for high-resolution imaging and mechanical characterization of a wide range of samples. However, this technique can be ...
Abstract: In recent years, the challenge of poor selectivity in a single gas sensor has received significant interest. This work presents a facile method for the concurrent analysis of sensor ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback