ATPG (Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an EDA method/technology used to find an input or test sequence. When applied to a digital circuit, ATPG enables ...
Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...
A UNSW Sydney mathematician has discovered a new method to tackle algebra's oldest challenge—solving higher polynomial equations. Polynomials are equations involving a variable raised to powers, such ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...
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